06/19/2013

Dr. Schenk GmbH Industriemesstechnik

Dr. Schenk MIDA (Multiple Image Defect Analysis): Defects from all perspectives for better quality and lower costs

Same gel defect with absorption, distortion and scattering information  (from left to right)
Viewing a defect with different illumination setups can reveal important information. Some low-contrast defects for example are difficult to detect using visible light but can be easily detected using infrared light. Dr. Schenk uses MIDA to ensure that all defects are caught.

One scan lines (saves valuable production space) one camera (saves money) and multiple illumination sources provide extensive defect information. Only the combined evaluation from multiple sources leads to reliable defect classification, essential in order to optimize quality control and process control.

The following images of gel defects in extruded film, wrinkles and bubbles are a small sample to illustrate just how superior Dr. Schenk's MIDA technology is: MIDA helps to reveal defects that remain almost invisible to conventional inspection solutions. MIDA is more that up to the task of inspecting modern films and foils for sophisticated end user applications, heralding a change in inspection technology.